发明名称 TREATMENT METHOD IN LIQUID AND TREATMENT DEVICE IN LIQUID
摘要 PROBLEM TO BE SOLVED: To excellently rotate wafers even when the wafers inside a wafer carrier are sucked to one another during treatment at the time of the alkali etching treatment of semiconductor wafers. SOLUTION: While treating a plurality of the wafers 3 loaded on the wafer carrier 1 inside an etching bath 7, a plurality of rollers 5a, 5b and 5c are pressed around the wafers 3, and the wafers 3 are forcibly rotated by a driving roller 5a in a state of securing a strong friction force between the wafers 3 and the rollers 5a, 5b and 5c. Or, by widening an interval between the plurality of wafers 3 housed in the wafer carrier 1, a suction force between the wafers 3 is weakened and rotation defects of the wafers 3 are prevented. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005116871(A) 申请公布日期 2005.04.28
申请号 JP20030350752 申请日期 2003.10.09
申请人 KOMATSU ELECTRONIC METALS CO LTD 发明人 KUROSAWA YOSHIAKI
分类号 B08B3/04;H01L21/304;H01L21/306;H01L21/673;H01L21/68;(IPC1-7):H01L21/304 主分类号 B08B3/04
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