发明名称 Reduce 1/f noise in NPN transistors without degrading the properties of PNP transistors in integrated circuit technologies
摘要 An interfacial oxide layer ( 185 ) is formed in the emitter regions of the NPN transistor ( 280, 220 ) and the PNP transistor ( 290, 200 ). Fluorine is selectively introduced into the polysilicon emitter region of the NPN transistor ( 220 ) to reduce the 1/f noise in the NPN transistor.
申请公布号 US2005087812(A1) 申请公布日期 2005.04.28
申请号 US20040994563 申请日期 2004.11.22
申请人 TROGOLO JOE R.;LOFTIN WILLIAM;KYSER WILLIAM F.JR. 发明人 TROGOLO JOE R.;LOFTIN WILLIAM;KYSER WILLIAM F.JR.
分类号 H01L21/331;H01L21/8228;H01L27/082;H01L29/08;(IPC1-7):H01L29/74 主分类号 H01L21/331
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