发明名称 |
Reduce 1/f noise in NPN transistors without degrading the properties of PNP transistors in integrated circuit technologies |
摘要 |
An interfacial oxide layer ( 185 ) is formed in the emitter regions of the NPN transistor ( 280, 220 ) and the PNP transistor ( 290, 200 ). Fluorine is selectively introduced into the polysilicon emitter region of the NPN transistor ( 220 ) to reduce the 1/f noise in the NPN transistor.
|
申请公布号 |
US2005087812(A1) |
申请公布日期 |
2005.04.28 |
申请号 |
US20040994563 |
申请日期 |
2004.11.22 |
申请人 |
TROGOLO JOE R.;LOFTIN WILLIAM;KYSER WILLIAM F.JR. |
发明人 |
TROGOLO JOE R.;LOFTIN WILLIAM;KYSER WILLIAM F.JR. |
分类号 |
H01L21/331;H01L21/8228;H01L27/082;H01L29/08;(IPC1-7):H01L29/74 |
主分类号 |
H01L21/331 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|