发明名称 Methods of forming capacitors
摘要 A method of forming a capacitor includes forming a first capacitor electrode over a semiconductor substrate. A capacitor dielectric region is formed onto the first capacitor electrode. The capacitor dielectric region has an exposed oxide containing surface. The exposed oxide containing surface of the capacitor dielectric region is treated with at least one of a borane or a silane. A second capacitor electrode is deposited over the treated oxide containing surface. The second capacitor electrode has an inner metal surface contacting against the treated oxide containing surface. Other aspects and implementations are contemplated.
申请公布号 US2005090069(A1) 申请公布日期 2005.04.28
申请号 US20030695959 申请日期 2003.10.27
申请人 MILLER MATTHEW W.;BASCERI CEM 发明人 MILLER MATTHEW W.;BASCERI CEM
分类号 H01L21/02;H01L21/3115;H01L21/316;H01L21/8242;(IPC1-7):H01L21/824;H01L21/822 主分类号 H01L21/02
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