首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Konfigurierbare Testkontakte zum Erleichtern der parallelen Prüfung von integrierten Schaltungen
摘要
申请公布号
DE69633695(T2)
申请公布日期
2005.04.28
申请号
DE19966033695T
申请日期
1996.04.26
申请人
STMICROELECTRONICS, INC.
发明人
BRANNIGAN, MICHAEL JOSEPH;LYSINGER, MARK ALAN;MCCLURE, DAVID CHARLES
分类号
G01R31/28;G11C29/48;(IPC1-7):G01R1/04;G01R31/316
主分类号
G01R31/28
代理机构
代理人
主权项
地址
您可能感兴趣的专利
IMPROVEMENTS IN AND RELATING TO ELECTRO-SLAG REMELTING OF METALS
MULTI-STATION BLASTING MACHINES
TWO PHASE COBALT IRON ALLOYS PREPARED BY POWDER METALLURGY
IMPROVEMENTS IN AND RELATING TO THE CROSSLINKING OF POLYMERS
TELEPHONE SUBSET
DRAWING DEVICE
SMOKERS' LIGHTERS
AUSTENITIC HEAT-RESISTANT ALLOY STEEL
IMPROVEMENTS IN OR RELATING TO MOSAICS
IMPROVEMENTS IN OR RELATING TO MOTOR VEHICLES WITH SUNVISORS
NUCLEAR REACTORS
PROCESS FOR DYEING TEXTILE MATERIALS
BROADCAST SYSTEM FOR A CONTROL SIGNAL
TELEPHONE SUBSET
IMPROVEMENTS IN OR RELATING TO LIQUID LEVEL DETECTORS
IMPROVEMENTS IN OR RELATING TO PREPARATION OF NONWOVEN FABRICS
IMPROVEMENTS IN OR RELATING TO PHOTO-ELECTRIC CELLS
A PROCESS FOR THE PRODUCTION OF POLYMERS
IMPROVEMENTS IN OR RELATING TO PRODUCTION OF FORMED ARTICLES OF BLACKENED STAINLESS STEEL
COMBUSTION INSTALLATION FOR INDUSTRIAL OVENS
