An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of objects being inspected. An arc lamp with an elliptical reflector in combination with a condenser lens focuses a more intense beam of light through the objective lens, thereby providing sufficient brightness without sacrificing any depth of field.
申请公布号
WO2005038424(A2)
申请公布日期
2005.04.28
申请号
WO2004US33798
申请日期
2004.10.13
申请人
BAUSCH & LOMB INCORPORATED;BERGENDAHL, MARC;LEWISON, DAVID;PUFFER, RAYMOND, H., JR.