发明名称 A METHOD AND APPARATUS FOR SENSING APPLIED FORCES
摘要 <p>An apparatus for sensing a force. The apparatus includes a nanostructure being suitable for emitting electrons and a collector. The collector is proximately positioned with respect to the nanostructure so as to receive the emitted electrons and define a gap therebetween. The gap is partially dependent upon the applied force and the emission and reception of the electrons are indicative of the applied force.</p>
申请公布号 WO2005038468(A1) 申请公布日期 2005.04.28
申请号 WO2003US12536 申请日期 2003.09.22
申请人 BROTHER INTERNATIONAL CORPORATION;DARTY, MARK, ANTHONY;HABIB, MOHAMADINEJAD 发明人 DARTY, MARK, ANTHONY;HABIB, MOHAMADINEJAD
分类号 B81B1/00;G01L1/00;G01P15/08;G01P15/18;(IPC1-7):G01P15/08;G01L9/00;B81B3/00 主分类号 B81B1/00
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