| 摘要 |
PROBLEM TO BE SOLVED: To provide a mass spectroscope capable of improving mass resolution of various kinds of ions including fragment ions generated by cleaving targeted ions without increasing the size of the mass spectroscope. SOLUTION: Ions generated by an ion generation source 1 are introduced into an ion trap 2; the ions are selected and cleaved in the ion trap 2 and thereafter the various kinds of fragment ions are extracted from the ion trap 2 and put on an orbit A through an gate electrode 31 in a main flight space 3. A long flight distance is secured by flying the fragment ions on the orbit A a predetermined number of times, and thereby the difference of flight time is expanded. After an error due to aberration is corrected by further turning back the ions by an ion reflector 4, the ions are entered into an ion detector 5. Thereby, the various kinds of fragment ions can be analyzed at high mass resolution without increasing the size of the mass spectroscope. COPYRIGHT: (C)2005,JPO&NCIPI
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