发明名称 Process for removing impurities from low dielectric constant films disposed on semiconductor devices
摘要 A process of removing impurities from a cured low dielectric constant organic polymeric film disposed on a semiconductor device. The process involves disposing a low dielectric constant curable organic polymeric film on an electrically conductive surface of a semiconductor device. The organic polymeric film is cured on the semiconductor device and thereupon contacted with supercritical carbon dioxide, optionally in the presence of at least one cosolvent.
申请公布号 US2005087490(A1) 申请公布日期 2005.04.28
申请号 US20030695374 申请日期 2003.10.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHACE MARK S.;HEDRICK JEFFREY C.;HICHRI HABIB;POPE KEITH R.;LEE JIA;MALONE KELLY;MCCULLOUGH KENNETH J.;MOREAU WAYNE;RESTAINO DARRYL D.;SIDDIQUI SHAHAB
分类号 B01D11/04;(IPC1-7):B01D11/00 主分类号 B01D11/04
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