发明名称 Method of dressing polishing pad and polishing apparatus
摘要 A method to quantitatively detect an optimum endpoint of dressing of a polishing pad with a non-destructive monitoring of a surface of the polishing pad is offered. The polishing pad is dressed for a predetermined period, and roughness of the surface of the polishing pad is measured with an optical measurement device made of a laser focus displacement meter. Then a characteristic curve representing a correlation between surface roughness of the polishing pad and dressing time is obtained. A gradient of the surface roughness versus dressing time characteristic curve is obtained. Dressing is stopped when the gradient reaches a predetermined value of gradient. These steps are repeated until the gradient of the surface roughness versus dressing time characteristic curve reaches the predetermined value of gradient.
申请公布号 US2005090185(A1) 申请公布日期 2005.04.28
申请号 US20040941083 申请日期 2004.09.15
申请人 ROHM CO., LTD. 发明人 FUJISHIMA TATSUYA;SAMESHIMA KATSUMI
分类号 B24B53/00;B24B37/00;B24B37/04;B24B49/12;B24B53/007;B24B53/017;B24B53/02;H01L21/304;(IPC1-7):B24B49/00 主分类号 B24B53/00
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