发明名称 REAL TIME CLOSED-LOOP PROCESS CONTROL SYSTEM FOR DEFECT PREVENTION
摘要 A method is provided for executing a monitoring process during a manufacturing process to produce products. The method measures, in real time, performance variables of an upstream portion of a present manufacturing process, analyzes, with a processor, trends in the performance variables of the present manufacturing process together with data that models a portion of a subsequent manufacturing process, that occurs after the present manufacture process, to predict performance of the subsequent manufacturing process, sends trend analysis information to the present manufacturing process, and sends information to the subsequent manufacturing process.
申请公布号 WO2005015403(A3) 申请公布日期 2005.04.28
申请号 WO2004US25553 申请日期 2004.08.06
申请人 SIEMENS LOGISTICS AND ASSEMBLY SYSTEMS INC. 发明人 NGUYEN, TUAN MINH
分类号 G05B19/418;G05B23/02 主分类号 G05B19/418
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