发明名称 ATOMIC LAYER DEPOSITION OF CMOS GATES
摘要 Structures, systems and methods for transistors having gates with variable work functions formed by atomic layer deposition are provided. One transistor embodiment includes a first source/drain region, a second source/drain region, and a channel region therebetween. A gate is separated from the channel region by a gate insulator. The gate includes a ternary metallic conductor formed by atomic layer deposition to provide the ternary metal conductor with a composition engineered to provide a desired thereshold voltage.
申请公布号 KR20050038630(A) 申请公布日期 2005.04.27
申请号 KR20057003033 申请日期 2005.02.22
申请人 MICRON TECHNOLOGY, INC. 发明人 AHN, KIE, Y.;FORBES, LEONARD
分类号 H01L21/28;H01L21/285;H01L21/8238;H01L27/092;H01L27/10;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/336;H01L21/822 主分类号 H01L21/28
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