发明名称 |
Thermal processing apparatus performing irradiating a substrate with light |
摘要 |
A plurality of flash lamps are covered with a reflector. Optical fiber members are attached to the reflector on portions located immediately above the flash lamps. When the flash lamps emit flash light toward a semiconductor wafer, the optical fiber members partially guide the emitted light so that a CCD measures the intensity of light emitted from each of the plurality of flash lamps. A computer detects the emission state of each of the plurality of flash lamps on the basis of a result of measurement. At this time, the computer compares standard luminous intensity obtained when the irradiation state on the semiconductor wafer satisfies a prescribed criterion with the luminous intensity in actual processing for detecting the emission states of the plurality of flash lamps. Thus provided is a thermal processing apparatus capable of reliably and simply detecting deterioration of lamps.
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申请公布号 |
US6885815(B2) |
申请公布日期 |
2005.04.26 |
申请号 |
US20030620874 |
申请日期 |
2003.07.16 |
申请人 |
DAINIPPON SCREEN MFG. CO., LTD. |
发明人 |
KUSUDA TATSUFUMI;IKUMI YUKO |
分类号 |
H01L21/00;(IPC1-7):F26B19/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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地址 |
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