| 摘要 |
An apparatus and a method are provided which allow two opposite plane surfaces of a body to be interferometrically measured simultaneously using light from a single light source. From a parallel light beam (P) produced by a light source ( 1 ) partial light beams (A, B) having positive and negative diffraction angles are produced using a beam splitter ( 8 ) in the form of a diffraction grating. The partial light beams strike the respective surfaces ( 90, 91 ) of the body ( 9 ) to be measured and are reflected thereat. The reflected partial light beams (A, B) are interfered with the throughgoing partial light beam (P) having an order of diffraction of zero and the thus produced interference patterns are digitized and subtracted from each other, whereby the parallelism of both surfaces ( 90, 91 ) of the body can be determined.
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