发明名称 NITRIDE LAYER FORMING METHODS
摘要 Nitride layer formation includes a method where a material is electrodeposited on a substrate and converted, at least in part, to a layer comprising nitrogen and the electrodeposited material. The electrodepositing may occur substantially selective on a conductive portion of the substrate. Also, the converting may comprise exposing the electrodeposited material to a nitrogen-comprising plasma. Chromium nitride and chromium oxynitride are examples of nitrogen-comprising materials. Copper or gold wiring of an integrated circuit are examples of a substrate. The chromium may be converted to a chromium-nitride-comprising diffusion barrier using a nitrogen-comprising plasma.
申请公布号 KR100484966(B1) 申请公布日期 2005.04.25
申请号 KR20027010824 申请日期 2001.03.01
申请人 发明人
分类号 H01L21/28;H01L21/768;C23C8/02;C23C28/00;H01L21/288;H01L21/3205;H01L23/52;H01L23/532;(IPC1-7):H01L21/768 主分类号 H01L21/28
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