发明名称 COMPOSITION FOR FORMING ETCHING STOPPER LAYER
摘要 Disclosed is a composition for forming an etching stopper layer which has dry etching selectivity ratio and low dielectric constant at the same time. Also disclosed is a method for manufacturing a semiconductor device wherein such a composition is used. Specifically, a composition for forming an etching stopper layer including a silicon-containing polymer is characterized in that the silicon-containing polymer included in the composition has a disilylbenzene structure. Also disclosed is a method for manufacturing a semiconductor device wherein an etching stopper layer is formed using such a composition.
申请公布号 WO2005036630(A1) 申请公布日期 2005.04.21
申请号 WO2004JP13125 申请日期 2004.09.09
申请人 AZ ELECTRONIC MATERIAL (JAPAN) K.K.;TASHIRO, YUJI;AOKI, HIROYUKI;ISHIKAWA, TOMONORI 发明人 TASHIRO, YUJI;AOKI, HIROYUKI;ISHIKAWA, TOMONORI
分类号 C08G77/52;C09D183/14;H01L21/311;H01L21/312;H01L21/768 主分类号 C08G77/52
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