Disclosed is a composition for forming an etching stopper layer which has dry etching selectivity ratio and low dielectric constant at the same time. Also disclosed is a method for manufacturing a semiconductor device wherein such a composition is used. Specifically, a composition for forming an etching stopper layer including a silicon-containing polymer is characterized in that the silicon-containing polymer included in the composition has a disilylbenzene structure. Also disclosed is a method for manufacturing a semiconductor device wherein an etching stopper layer is formed using such a composition.
申请公布号
WO2005036630(A1)
申请公布日期
2005.04.21
申请号
WO2004JP13125
申请日期
2004.09.09
申请人
AZ ELECTRONIC MATERIAL (JAPAN) K.K.;TASHIRO, YUJI;AOKI, HIROYUKI;ISHIKAWA, TOMONORI