发明名称 |
SYSTEM AND METHOD FOR MONITORING DEFECTS IN STRUCTURES |
摘要 |
A system and method for monitoring defects in a structure are provided. The system (I 10) includes a power supply (112) for supplying an electric curren t to a monitoring area (118) of the structure (114) and a reference (116); a measurement circuit for measuring a potential drop across at least two conta ct points (126, 128) of the monitoring area (118) and at least two contact poin ts (122, 124) of the reference (116); and a processor (112) adapted to determin e a ratio of the monitoring area potential drop to the reference potential dro p indicative of a percentage change in a thickness of the structure (114). The method includes the steps of supplying the current to the monitoring area (118) and the reference (116); measuring a first potential drop across the monitoring area (118) and the reference (116); and determining the ratio indicative of the percentage change in the thickness of the structure (114).
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申请公布号 |
CA2538304(A1) |
申请公布日期 |
2005.04.21 |
申请号 |
CA20042538304 |
申请日期 |
2004.08.10 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
MAY, ANDREW;BATZINGER, THOMAS;ALLISON, PETER;LESTER, CARL |
分类号 |
G01N27/20;G01B5/28;G01B7/06;G01B7/28 |
主分类号 |
G01N27/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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