发明名称 SUPERDENSE DATA MEMORY USING PHASE CHANGE DIODE MEMORY CELL, AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To solve the non-alignment of a junction or the like, in a phase change diode memory. <P>SOLUTION: The superdense data memory (200) uses the phase change diode memory cell and has a plurality of ejectors (102, 104) for irradiating the beam (105) of an effective energy, a layer (202) for forming a plurality of data memory cells and diode structures (202, 204) laminated to detect the memory of the memory cell or a data status; the device can vary the status with the beam (105) from the ejectors (102, 104) and includes a phase change data memory layer (202) comprising a material containing copper, indium and selenium. In addition, a method for forming the diode structure of a phase change data memory array is also provided. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005109473(A) 申请公布日期 2005.04.21
申请号 JP20040274949 申请日期 2004.09.22
申请人 HEWLETT-PACKARD DEVELOPMENT CO LP 发明人 ASHTON GARY R;DAVIDSON ROBERT J
分类号 G11B9/00;G11B9/10;G11B11/00;G11B11/08;H01L27/105;H01L45/00 主分类号 G11B9/00
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