发明名称 |
Method for fabricating a gate structure of a FET and gate structure of a FET |
摘要 |
A method for fabricating a gate structure of a FET, having: (a) deposition and patterning of a sacrificial layer sequence on a semiconductor substrate and uncovering of a gate section; (b) implantation of a channel doping into the gate section; (c) deposition and patterning of spacers at the sidewalls of the sacrificial layer sequence with the formation of a gate section that is not covered by the spacers; (d) introduction of a mask material into the gate section that is not covered by the spacers; (e) removal of the spacers selectively with respect to the sacrificial layer sequence and mask material); (f) implantation of a halo doping in regions uncovered by the removed spacers; (g) removal of the mask material; (h) formation of a gate on the gate section; and (j) removal of the sacrificial layer sequence selectively with respect to the gate.
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申请公布号 |
US2005085043(A1) |
申请公布日期 |
2005.04.21 |
申请号 |
US20040897403 |
申请日期 |
2004.07.23 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
ENDERS GERHARD;VOIGT PETER |
分类号 |
G11C7/00;H01L21/336;H01L29/49;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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