发明名称 System & method for performing design rule check
摘要 An improved system and method is disclosed for performing a design rule check on a proposed integrated circuit (IC) layout, and for creating customized design rule check command files. The individual layers of the IC (a system on chip-SOC) are separated into different regions having different kinds of features (i.e., memory or logic). Each different type of region is then analyzed in accordance with the customized design rule command file so that so-called "false errors" are eliminated. The invention thus improves, among other things, a development time for getting a design implemented in silicon.
申请公布号 US2005086619(A1) 申请公布日期 2005.04.21
申请号 US20040982650 申请日期 2004.11.05
申请人 TEH CHEEHOE;LAM NIMCHO;TRUONG MAU 发明人 TEH CHEEHOE;LAM NIMCHO;TRUONG MAU
分类号 G06F17/50;(IPC1-7):G06F9/45 主分类号 G06F17/50
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