发明名称 Over-coating composition for photoresist and process for forming photoresist pattern using the same
摘要 Overcoating compositions for a photoresist and methods of using the same are disclosed. More specifically, overcoating compositions for a photoresist comprising materials which can weaken acid stably are disclosed. These materials neutralize large amounts of acid produced in the upper portion of a photoresist film, thereby uniformizing vertical distribution of the acids. As a result, vertical and fine patterns of less than 100 nm thickness can be obtained.
申请公布号 US2005084795(A1) 申请公布日期 2005.04.21
申请号 US20040875853 申请日期 2004.06.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG JAE CHANG
分类号 G03C1/76;G03F7/004;G03F7/039;G03F7/11;G03F7/20;H01L21/027;(IPC1-7):G03C1/76 主分类号 G03C1/76
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