| 摘要 |
PROBLEM TO BE SOLVED: To provide an alternative technology for making the estimation of life expectancy more precise. SOLUTION: The alternative technology for the device for measuring the remaining life is composed of the electron microscopes 1, 2 for imaging the polished surface of the reference life measurement subject and the computers 6, 8. The computers 6, 8 constitute: a first calculation part 6 for calculating the KAM corresponding to the surface azimuth difference obtained by the electron microscopes 1, 2; a second calculation parts 13, 15 for preparing a master curve representing the relation about the remaining life of the reference life measurement subject corresponding to a first KAM of reference life of the measurement subject loaded with a first time interval and a second KAM of reference life of the measurement subject loaded with a second time interval after the first time interval; and a third calculation parts 17, 18 for outputting the remaining life of the remaining life estimation subject represented by the master curve from the KAM of the remaining life estimation subject and the KAM of the master curve. The master curve provided with temperature information during receiving the load on the reference life measurement subject, or strain, or both. The master curve is prepared regarding the vicinity of the central region of the crystal grain, and the boundary region of the crystal grain, thereby precise estimation of life can be alternatively attained. COPYRIGHT: (C)2005,JPO&NCIPI
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