发明名称 POLISHING COMPOSITION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing composition capable of suppressing the occurrence of a surface step difference, by suppressing the progress of dishing and the progress of erosion. <P>SOLUTION: The polishing composition contains following constituents (a) to (e), where (a): colloidal silica, (b): acid, (c): anticorrosive, (d): complete saponification polyvinyl alcohol, and (e): water. This polishing composition is used for manufacturing a wiring structure. The wiring structure is provided with an insulating film having wiring trenches on its surface, a conductor film provided to the wiring trenches, and a barrier film interposed between the insulation film and the conductor film. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005109257(A) 申请公布日期 2005.04.21
申请号 JP20030342532 申请日期 2003.09.30
申请人 FUJIMI INC 发明人 GO TOSHITERU;KAWAMURA ATSUKI
分类号 B24B37/00;C09K3/14;H01L21/304;H01L21/3205;H01L21/321;H01L21/768;(IPC1-7):H01L21/304;H01L21/320 主分类号 B24B37/00
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