发明名称 |
Method of measuring dielectric constant of PCB for RIMM |
摘要 |
Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.
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申请公布号 |
US6882161(B2) |
申请公布日期 |
2005.04.19 |
申请号 |
US20030447348 |
申请日期 |
2003.05.28 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
KIM YOUNG-WOO;RHEE BYOUNG-HO;YANG DEK-GIN;CHO YOUNG-SANG;LEE DONG-HWAN |
分类号 |
G01R27/06;(IPC1-7):G01R31/08;G01R31/11;G01R37/02 |
主分类号 |
G01R27/06 |
代理机构 |
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