发明名称 Strained silicon NMOS devices with embedded source/drain
摘要 A planar NFET on a strained silicon layer supported by a SiGe layer achieves reduced external resistance by removing SiGe material outside the transistor body and below the strained silicon layer and replacing the removed material with epitaxial silicon, thereby providing lower resistance for the transistor electrodes and permitting better control over Arsenic diffusion.
申请公布号 US6881635(B1) 申请公布日期 2005.04.19
申请号 US20040708746 申请日期 2004.03.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHIDAMBARRAO DURESETI;LEOBANDUNG EFFENDI;MOCUTA ANDA C.;YANG HAINING S.;ZHU HUILONG
分类号 C30B25/18;C30B29/06;H01L21/20;H01L21/285;H01L21/336;H01L29/10;H01L29/78;H01L29/786;(IPC1-7):H01L21/336;H01L21/36;C30B23/00 主分类号 C30B25/18
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