发明名称 COMPOSITION FOR POLISHING SEMICONDUCTOR LAYER
摘要 <P>PROBLEM TO BE SOLVED: To provide an aqueous polishing composition which controls a removing speed when a silicon oxide-containing layer of a semiconductor device is removed, and a polishing method using it. <P>SOLUTION: The aqueous polishing composition includes a corrosion inhibitor for limiting the removal of an interconnect metal with an acidic pH. The composition includes organic-containing ammonium salt formed using a formula wherein R<SB>1</SB>, R<SB>2</SB>, R<SB>3</SB>and R<SB>4</SB>are radicals, and R1 has a carbon chain length of 2 to 15 carbon atoms. The organic-containing ammonium salt has a concentration that accelerates TEOS removal and decreases removal of at least one coating selected from a group consisting of SiC, SiCN, Si<SB>3</SB>N<SB>4</SB>and SiCO. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101545(A) 申请公布日期 2005.04.14
申请号 JP20040228852 申请日期 2004.08.05
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 LIU ZHENDONG;QUANCI JOHN
分类号 B24B37/00;C09G1/02;C09K3/14;H01L21/304;H01L21/3105;H01L21/321 主分类号 B24B37/00
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