发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which improves the characteristics and reliability of the device. SOLUTION: The method of manufacturing the semiconductor device comprises processes of: forming a foundation region including an interlayer insulation film 108 on a semiconductor substrate 100; forming an alumina film 117 on the foundation region; forming a hole in the alumina film, filling up the hole with bottom electrode films 118 and 119, forming a dielectric film 121 on the bottom electrode films; and forming a top electrode film 122 on the dielectric film. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005101213(A) |
申请公布日期 |
2005.04.14 |
申请号 |
JP20030332038 |
申请日期 |
2003.09.24 |
申请人 |
TOSHIBA CORP;INFINEON TECHNOLOGIES AG |
发明人 |
IMAI KEITAROU;YAMAKAWA KOJI;ITOKAWA HIROSHI;NATORI KATSUAKI;ARISUMI OSAMU;NAKAZAWA HIROSUKE;BUN NORIKI |
分类号 |
H01L21/304;H01L21/02;H01L21/768;H01L21/8246;H01L27/105;H01L27/115;(IPC1-7):H01L27/105 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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