发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which improves the characteristics and reliability of the device. SOLUTION: The method of manufacturing the semiconductor device comprises processes of: forming a foundation region including an interlayer insulation film 108 on a semiconductor substrate 100; forming an alumina film 117 on the foundation region; forming a hole in the alumina film, filling up the hole with bottom electrode films 118 and 119, forming a dielectric film 121 on the bottom electrode films; and forming a top electrode film 122 on the dielectric film. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101213(A) 申请公布日期 2005.04.14
申请号 JP20030332038 申请日期 2003.09.24
申请人 TOSHIBA CORP;INFINEON TECHNOLOGIES AG 发明人 IMAI KEITAROU;YAMAKAWA KOJI;ITOKAWA HIROSHI;NATORI KATSUAKI;ARISUMI OSAMU;NAKAZAWA HIROSUKE;BUN NORIKI
分类号 H01L21/304;H01L21/02;H01L21/768;H01L21/8246;H01L27/105;H01L27/115;(IPC1-7):H01L27/105 主分类号 H01L21/304
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