发明名称 GROUP III NITRIDE SEMICONDUCTOR CRYSTAL, PRODUCTION METHOD OF THE SAME, GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a production method of a group III nitride semiconductor crystal capable of forming a high quality group III nitride semiconductor crystal in a process where a temperature fluctuation is relatively small. <P>SOLUTION: A group III material is supplied to a heated sapphire (Al<SB>2</SB>O<SB>3</SB>) substrate 9 at a V/III ratio (the ratio of the molecular number of the molecules including a group III element flowing into a reactor and that of the molecules including a group V element) of 500 or less (including the case that the V/III ratio is 0) to form a group III nitride semiconductor 8 including at least Al, then, vapor phase epitaxy (VPE) is performed on a group III nitride semiconductor crystal 7 on the substrate at a substrate temperature of 950 to 1,200&deg;C and the substrate temperature in the first process or less by using the group III material and a nitrogen material. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101623(A) 申请公布日期 2005.04.14
申请号 JP20040301065 申请日期 2004.10.15
申请人 SHOWA DENKO KK 发明人 MIKI HISAYUKI;SAKURAI TETSURO;OKUYAMA MINEO
分类号 H01L21/205;H01L33/06;H01L33/32 主分类号 H01L21/205
代理机构 代理人
主权项
地址