发明名称 |
GROUP III NITRIDE SEMICONDUCTOR CRYSTAL, PRODUCTION METHOD OF THE SAME, GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL WAFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a production method of a group III nitride semiconductor crystal capable of forming a high quality group III nitride semiconductor crystal in a process where a temperature fluctuation is relatively small. <P>SOLUTION: A group III material is supplied to a heated sapphire (Al<SB>2</SB>O<SB>3</SB>) substrate 9 at a V/III ratio (the ratio of the molecular number of the molecules including a group III element flowing into a reactor and that of the molecules including a group V element) of 500 or less (including the case that the V/III ratio is 0) to form a group III nitride semiconductor 8 including at least Al, then, vapor phase epitaxy (VPE) is performed on a group III nitride semiconductor crystal 7 on the substrate at a substrate temperature of 950 to 1,200°C and the substrate temperature in the first process or less by using the group III material and a nitrogen material. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005101623(A) |
申请公布日期 |
2005.04.14 |
申请号 |
JP20040301065 |
申请日期 |
2004.10.15 |
申请人 |
SHOWA DENKO KK |
发明人 |
MIKI HISAYUKI;SAKURAI TETSURO;OKUYAMA MINEO |
分类号 |
H01L21/205;H01L33/06;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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