发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD, CIRCUIT BOARD AND ELECTRONIC EQUIPMENT
摘要 <P>PROBLEM TO BE SOLVED: To improve a reliability by preventing the peeling of a semiconductor board regarding a semiconductor device and a manufacturing method for the semiconductor device, the circuit board and electronic equipment. <P>SOLUTION: The semiconductor device has a first board 20, a second board 30 overlapped with the board 20, and the semiconductor board 10 interposed between the board 20 and the board 30. The board 20 and the board 30 are bonded mutually in the peripheral region of the semiconductor board 10. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101250(A) 申请公布日期 2005.04.14
申请号 JP20030332762 申请日期 2003.09.25
申请人 SEIKO EPSON CORP 发明人 MASUTANI HIROSHI
分类号 H01L23/29;H01L21/56;H01L23/12;H01L23/31;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L23/29
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