发明名称 SAMPLE TEST METHOD AND SAMPLE TEST SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a sample test system and a sample test method that can simply and reliably batch-change the setting conditions of a plurality of test apparatuses to the same setting conditions, in facilities, such as a testing center having a plurality of test apparatuses of the same type. SOLUTION: The sample test system, which comprises a plurality of test apparatuses 32 for analyzing specific components in a sample and an information processing apparatus 12 for managing tests by the test apparatuses 32 and processing and managing test result, and in which the test apparatuses 32 and the information processing apparatus 12 can exchange data via a communication line, comprises batch-changing means for, when changed setting conditions are input into the information processing apparatus 12 and the test apparatuses 32 that should be subjected to setting condition changes from the information processing apparatus 12 are selected; if two or more test apparatuses 32 are selected, sending the change data from the information processing apparatus 12 to two or more selected test apparatuses 32 via the communication line, to batch-change setting conditions of the two or more selected test apparatuses 32 to the same setting conditions. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005099061(A) 申请公布日期 2005.04.14
申请号 JP20050005885 申请日期 2005.01.13
申请人 ARKRAY INC 发明人 TANAKA MASATO
分类号 G01N35/00;(IPC1-7):G01N35/00 主分类号 G01N35/00
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