发明名称 Optical position measuring system
摘要 An optical position measuring system including a scale and a scanning unit. The scanning unit includes a light source that emits light beams and a periodic scanning graduation having scanning graduation marks arranged periodically at a scanning graduation period along a measuring direction. The scanning unit further including a detector arrangement. The scanning graduation or the scale graduation includes at least three partial tracks, which adjoin perpendicularly with respect to the measuring direction, and graduation marks associated with each of the at least three partial tracks have a defined and constant offset spacing from their nominal positions, wherein the offset spacings associated with adjoining ones of the at least three partial tracks differ, so that filtering of undesired harmonic waves out of the at least one periodic scanning signal results from said offset spacings.
申请公布号 US2005077457(A1) 申请公布日期 2005.04.14
申请号 US20040964179 申请日期 2004.10.13
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 HOFER VOLKER
分类号 G01D5/347;G01D5/36;G01D5/38;(IPC1-7):G01D5/34 主分类号 G01D5/347
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