发明名称 Method and system for temperature compensation for memory cells with temperature-dependent behavior
摘要 The preferred embodiments described herein relate to a method and system for temperature compensation for memory cells with temperature-dependent behavior. In one preferred embodiment, at least one of a first temperature-dependent reference voltage comprising a negative temperature coefficient and a second temperature-dependent reference voltage comprising a positive temperature coefficient is generated. One of a wordline voltage and a bitline voltage is generated from one of the at least one of the first and second temperature-dependent reference voltages. The other of the wordline and bitline voltages is generated, and the wordline and bitline voltages are applied across a memory cell. Other methods and systems are disclosed for sensing a memory cell comprising temperature-dependent behavior, and each of the preferred embodiments can be used alone or in combination with one another.
申请公布号 US2005078537(A1) 申请公布日期 2005.04.14
申请号 US20030676862 申请日期 2003.09.30
申请人 MATRIX SEMICONDUCTOR, INC. 发明人 SO KENNETH;FASOLI LUCA;KLEVELAND BENDIK
分类号 G11C7/04;(IPC1-7):G11C7/04 主分类号 G11C7/04
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