发明名称 Method for producing silicon epitaxial wafer
摘要 When manufacturing a silicon epitaxial wafer by forming a silicon epitaxial layer through vapor phase growth on a front surface of a semiconductor substrate W with a CVD oxide film formed on a rear surface thereof, there is used a susceptor (20) where a pocket (21) inside which the semiconductor substrate W is disposed is formed and at least one pore (22) which passes through the susceptor (20) to a rear surface thereof and is open even during the vapor phase growth is formed in a more central position than that of an outermost peripheral portion inside the pocket (21), and the semiconductor substrate W is disposed such that the CVD oxide film faces the at least one pore (22), thus forming the silicon epitaxial layer on the front surface of the semiconductor substrate W through the vapor phase growth.
申请公布号 US2005079690(A1) 申请公布日期 2005.04.14
申请号 US20040505025 申请日期 2004.08.19
申请人 SUKA AKIHIKO;NAKASUGI TADASHI;ARAI TAKESHI 发明人 SUKA AKIHIKO;NAKASUGI TADASHI;ARAI TAKESHI
分类号 H01L21/205;C23C16/458;C30B25/02;C30B25/12;C30B29/06;(IPC1-7):C30B1/00;H01L21/20;H01L21/36 主分类号 H01L21/205
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