发明名称 INSTRUMENT FOR MEASURING PLANAR DISPLAY DEVICE AND ITS OPERATING METHOD
摘要 PROBLEM TO BE SOLVED: To apply a shorting bar measurement and a full contact measurement at the same time. SOLUTION: A display device includes a display unit consisting of a measuring instrument 110, a gate driving circuit 150, a plurality of 1st driving lines 122, and a plurality of gate driving lines 152. The individual units of this display unit include a transistor 154, a capacitor 156 for storage, and a pixel unit 158. The measuring instrument 110 is electrically connected to the 1st driving lines 112, a video signal source, and a shorting bar signal source. Then this measuring instrument 110 includes a 1st connection part 120, n pieces of probing ends P<SB>1</SB>to P<SB>n</SB>, and n pieces of switch elements S<SB>1</SB>to S<SB>n</SB>. Here, n is an integer larger than 1. The shorting bar measurement or full contact measurement of the planar display device is discriminated on the basis of the potential supplied from the shorting bar signal source. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005099543(A) 申请公布日期 2005.04.14
申请号 JP20030334613 申请日期 2003.09.26
申请人 TOPPOLY OPTOELECTRONICS CORP 发明人 SHAO-II RIN;CHAN-MIN CHAO
分类号 G01R31/00;G02F1/13;G02F1/133;G09F9/00;H01L51/50;H05B33/10;H05B33/12;H05B33/14;(IPC1-7):G09F9/00 主分类号 G01R31/00
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