发明名称 |
REINFORCED SOLDER BUMP AND METHOD OF FORMING REINFORCED SOLDER BUMP STRUCTURE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a reinforced solder bump structure that prevents mechanical stresses caused by a difference of coefficients of thermal expansion between components during working on a final device, a crack that may occur in the solder bump material owing to thermal circulation, and crack propagation, and also to provide a method of forming the reinforced solder bump structure. <P>SOLUTION: A method of manufacturing solder bumps comprises steps of: forming a first protrusion 311 extending upwardly from a contact pad 102 of a semiconductor chip 101; forming a second protrusion 312 extending upwardly from a ball pad of a mounting substrate 109; and forming the first protrusion 311 and second protrusion 312 within the solder material. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005101614(A) |
申请公布日期 |
2005.04.14 |
申请号 |
JP20040276006 |
申请日期 |
2004.09.22 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
JEONG SE-YOUNG;KIN NANSHAKU;OH SE YONG;KIM SOON-BUM;PARK SUN-YOUNG;RYU SHUGEN;LEE IN-YOUNG |
分类号 |
H01L21/60;B23K3/06;H01L23/485;H05K1/11;H05K3/24;H05K3/34 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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