发明名称 RESIST COMPOSITION AND FABRICATING METHOD OF SEMICONDUCTOR DEVICE USING IT
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition which functions as a protective film which is formed using a lithographic means and is used at etching, a doping or the like, and provide a fabricating process of a semiconductor device which has a high safety, employs an easy-to-handle substance as a resist stripper, and is considered for an environment. <P>SOLUTION: The resist composition includes a water-soluble homopolymer, water or a solvent which is compatible with water and in which the water-soluble homopolymer is dissolved. The fabricating method of the semiconductor device includes a process to remove with water the protection film formed by discharging the resist composition using the lithographic means, after use. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101543(A) 申请公布日期 2005.04.14
申请号 JP20040228001 申请日期 2004.08.04
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MURANAKA KOJI;NOMURA RYOJI;IMAI KEITAROU;MAEKAWA SHINJI
分类号 B41M5/00;H01L21/027;H01L21/3065;H05K3/06 主分类号 B41M5/00
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