发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To realize mixed loading of an MOSFET with an epitaxial channel structure and an MOSFET with an elevated source drain structure. SOLUTION: The gate electrode 17 of the MOSFET with an elevated source drain structure is formed, and then an epitaxial channel formation area 34 and an elevated source drain formation area 35 are made open to form openings, and furthermore, crystal growth is performed. Thus, a manufacturing process can be simplified. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005101278(A) |
申请公布日期 |
2005.04.14 |
申请号 |
JP20030333219 |
申请日期 |
2003.09.25 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
INOUE AKIRA;TAKAGI TAKESHI;SORADA HARUYUKI;KAWASHIMA YOSHIO |
分类号 |
H01L27/08;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/78;H01L29/786;(IPC1-7):H01L21/823;H01L21/823 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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