发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a high dielectric constant film that has little impurity content. SOLUTION: On a sublayer substrate, a first insulating film is formed, on which a second insulating film is formed that has a higher dielectric constant than the first one. After that, a gate electrode is formed on the second insulating film. Here, when forming the second insulating film, a cycle is repeated that consists of six steps, the six steps of supplying to a deposition system deposition materials for the second insulating film, purging the deposition materials supplied into the deposition system, supplying oxidizer for oxidizing the deposition materials, purging the oxidizer, supplying active species produced by generating a reduced gas plasma, and purging excessive active species. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005101529(A) 申请公布日期 2005.04.14
申请号 JP20040187217 申请日期 2004.06.25
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 KAWAHARA TAKAAKI
分类号 C23C16/44;H01L21/02;H01L21/28;H01L21/314;H01L21/316;H01L21/336;H01L29/51;H01L29/78;(IPC1-7):H01L29/78 主分类号 C23C16/44
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