发明名称 Wirebond structure and method to connect to a microelectronic die
摘要 A wirebond structure includes a copper pad formed on or in a surface of a microelectronic die. A conductive layer is included in contact with the copper pad and a bond wire is bonded to the conductive layer. The conductive layer is formed of a material to provide a stable contact between the bond wire and the copper pad in at least one of an oxidizing environment and an environment with temperatures up to at least about 350° C.
申请公布号 US2005079651(A1) 申请公布日期 2005.04.14
申请号 US20040001871 申请日期 2004.12.01
申请人 GLEIXNER ROBERT J.;DANIELSON DONALD;PALUDA PATRICK M.;NAIK RAJAN 发明人 GLEIXNER ROBERT J.;DANIELSON DONALD;PALUDA PATRICK M.;NAIK RAJAN
分类号 H01L21/603;H01L23/485;(IPC1-7):H01L21/44;H01L21/48 主分类号 H01L21/603
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