发明名称 Method of dividing circuit pattern, method of manufacturing stencil mask, stencil mask and method of exposure
摘要 A method of dividing a circuit pattern for creating complementary stencil masks corresponding to complementary patterns, the method comprising a step of dividing a circuit pattern into a plurality of complementary patterns including a first complementary pattern comprising a pattern of a cantilevered beam member having a support portion width W1 and a length L1, and a second complementary pattern comprising a pattern of a both end-supported beam member having a support portion width W2 and a length L2. The dividing of the circuit pattern is performed in a manner that a aspect ratio A1 (L1/W1) of the pattern of the cantilevered beam member is confined to not more than 100, and that a aspect ratio A2 (L2/W2) of the pattern of the both end-supported beam member is confined to not more than 150.
申请公布号 US2005079426(A1) 申请公布日期 2005.04.14
申请号 US20040948154 申请日期 2004.09.24
申请人 TOPPAN PRINTING CO., LTD. 发明人 EGUCHI HIDEYUKI;YOSHII TAKASHI;SUGIMURA HIROSHI;TAMURA AKIRA
分类号 G03F1/16;G03F1/20;(IPC1-7):G03F9/00;G03C5/00;G06F17/50 主分类号 G03F1/16
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