发明名称 |
Analytical method for determining crystallographic phases of a sample |
摘要 |
<p>The method involves acquiring an X-ray diffraction pattern of a measuring sample. A unit spectrum of the sample is acquired and concentrations of chemical units are determined in the sample. A quantitative phase analysis of the sample is performed using measured intensities. Differences between calculated and measured intensities of the pattern and between calculated and determined unit concentrations are simultaneously minimized.</p> |
申请公布号 |
EP1522847(A1) |
申请公布日期 |
2005.04.13 |
申请号 |
EP20040022630 |
申请日期 |
2004.09.23 |
申请人 |
BRUKER AXS GMBH |
发明人 |
KERN, ARNT, DR. |
分类号 |
G01J3/30;G01N23/20;G01N23/207;G01N23/223;(IPC1-7):G01N23/20 |
主分类号 |
G01J3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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