发明名称 Methods of forming source/drain regions using multilayer side wall spacers and structures so formed
摘要 Methods of forming a source/drain region can include the steps of forming a gate electrode on a substrate and forming a lightly doped source/drain region in the substrate self-aligned to the gate electrode. A first spacer can be formed on a side wall of the gate electrode. A second spacer can be formed on the first spacer on the side wall separate from the first spacer to provide a multilayer spacer on the side wall. A heavily doped source/drain region can be formed in the substrate self-aligned to the multilayer spacer. Related structures are also disclosed.
申请公布号 US6878597(B2) 申请公布日期 2005.04.12
申请号 US20030397970 申请日期 2003.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM DO-HYUNG
分类号 H01L21/28;H01L21/336;(IPC1-7):H01L21/336;H01L21/320;H01L21/44;H01L29/76 主分类号 H01L21/28
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