发明名称 |
CLEANING SOLUTION FOR PHOTORESIST AND METHOD FOR FORMING PATTERN USING THE SAME |
摘要 |
<p>A composition for a photoresist cleaning solution which is used at the end of a pattern developing process is provided to prevent the disintegration of patterns owing to its increased surface tension and thus to improve the stability of a patterning process. The composition for a photoresist cleaning solution comprises water as a main component and a surfactant comprising a compound represented by formula 1, in which R is H, an alkyl group having C8-20 or an alkylaryl group; m is an integer of 5-50; and n is an integer of 3-50, wherein the composition further comprises an alcohol compound.</p> |
申请公布号 |
KR20050033260(A) |
申请公布日期 |
2005.04.12 |
申请号 |
KR20030069239 |
申请日期 |
2003.10.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAN, KEUN DO;KIM, SAM YOUNG;LEE, GEUN SU |
分类号 |
C11D1/00;C11D1/06;C11D3/39;C11D11/00;G03C5/00;G03F7/32;(IPC1-7):G03F7/32 |
主分类号 |
C11D1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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