发明名称 CLEANING SOLUTION FOR PHOTORESIST AND METHOD FOR FORMING PATTERN USING THE SAME
摘要 <p>A composition for a photoresist cleaning solution which is used at the end of a pattern developing process is provided to prevent the disintegration of patterns owing to its increased surface tension and thus to improve the stability of a patterning process. The composition for a photoresist cleaning solution comprises water as a main component and a surfactant comprising a compound represented by formula 1, in which R is H, an alkyl group having C8-20 or an alkylaryl group; m is an integer of 5-50; and n is an integer of 3-50, wherein the composition further comprises an alcohol compound.</p>
申请公布号 KR20050033260(A) 申请公布日期 2005.04.12
申请号 KR20030069239 申请日期 2003.10.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAN, KEUN DO;KIM, SAM YOUNG;LEE, GEUN SU
分类号 C11D1/00;C11D1/06;C11D3/39;C11D11/00;G03C5/00;G03F7/32;(IPC1-7):G03F7/32 主分类号 C11D1/00
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