Method of selectively aligning and positioning nanometer-scale components using AC fields

摘要

An improved and novel method of selectively aligning and positioning nanometer-scale components using AC fields. The method provides for more precise manipulation of the nanometer-scale components in bridging test electrodes including the steps of: providing an alternating current (AC) field at a single electrode or between a plurality of electrodes to create an electric field in an environment containing nanometer-scale components. The electric field thereby providing for the aligning and positioning of the nanometer-scale components to the desired location.