发明名称 Method of forming LDD of semiconductor devices
摘要 A method of forming an LDD of a semiconductor device. A substrate having a polysilicon layer thereon is provided, wherein the polysilicon layer comprises a first region and a second region. A patterned photoresist layer is formed on the polysilicon layer for exposing the first region and covering the second region. The photoresist layer covering the second region comprises a middle portion and an edge portion, wherein the middle portion is thicker than the edge portion. Then, an ion implantation process is performed using the photoresist layer as a mask for forming a source/drain in the first region of the polysilicon layer and an LDD in the second region underneath the edge portion of the photoresist layer.
申请公布号 US6878577(B2) 申请公布日期 2005.04.12
申请号 US20030604761 申请日期 2003.08.14
申请人 AU OPTRONICS CORPORATION 发明人 SHIH MING-SUNG
分类号 G03F7/20;H01L21/027;H01L21/20;H01L21/265;H01L21/266;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L21/00 主分类号 G03F7/20
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