| 摘要 |
A channel for use in automatic test equipment and adapted for coupling to a device-under-test is disclosed. The channel includes a driver and respective AC and DC-coupled signal paths. The AC-coupled signal path is disposed at the output of the driver and is configured to propagate signal components at and above a predetermined frequency. The DC-coupled signal path is disposed in parallel with the AC-coupled signal path and is configured to propagate signal components from DC to the predetermined frequency.
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