发明名称 DEVICE FOR TAKING ELEMENTARY ANALYSIS BY MEANS OF SPECTROMETRY OF OPTICAL EMISSION ON LASER-GENERATED PLASMA
摘要 FIELD: measurement technology. ^ SUBSTANCE: device can be used for testing radionuclear materials and has pulse laser source, aids for focusing light from the source onto object to be subject to testing to get plasma onto surface of object, aid for testing plasma radiation spectrum, aid for determining element composition of object and aid for shifting object. ^ EFFECT: improved resolution. ^ 10 cl, 2 dwg
申请公布号 RU2249813(C2) 申请公布日期 2005.04.10
申请号 RU20010121681 申请日期 2000.11.02
申请人 发明人 LAKUR ZHAN-LJUK;VAGNER ZHAN-FRANSUA;DETALL' VINSENT;MOSH'EN PATRIK
分类号 G01N21/63;G01N21/71 主分类号 G01N21/63
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