Boundary scan test apparatus for integrated circuits.,申请号HK20010101675-传众专利搜索

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发明名称	Boundary scan test apparatus for integrated circuits.
摘要
申请公布号	HK1030810(A1)	申请公布日期	2005.04.08
申请号	HK20010101675	申请日期	2001.03.08
申请人	ATMEL CORPORATION	发明人	SRINIVAS RAMAMURTHY;JINGLUN TAM;GONGWER, GEOFFREY, S.;FAHEY, JAMES, JR.
分类号	G01R31/28;G01R31/3185;(IPC1-7):G01R	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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