| 摘要 |
PROBLEM TO BE SOLVED: To provide a time delay inspection circuit which can measure time delay accurately and repeatedly if necessary and enables measurement in a period of time shorter than the actual time delay. SOLUTION: The time delay inspection circuit is provided with an integrating capacitor C1; a first current source M5 for charging the capacitor C1; a discharging means M7 for discharging charge of the capacitor C1; and a comparison circuit CMP1 which compares a voltage of the capacitor with a reference voltage, and inverts an output when the voltage of the capacitor reaches the reference voltage. A time duration is formed from the state that the capacitor C1 is discharged, charging is performed by the first current source M5, and the capacitor reaches the reference voltage; to the state that the output of the comparison circuit CMP1 is inverted. An input terminal LATTES is installed which releases a second current source M3 for charging the capacitor C1 and a discharging means M7 of the capacitor C1, and inputs an inspection signal for charging of the capacitor C1 by a current in which a current of the second current source M3 is added to the first current source M5. COPYRIGHT: (C)2005,JPO&NCIPI
|
