| 摘要 |
PROBLEM TO BE SOLVED: To relatively easily prepare a burn-in pattern signal even by a person having no expert knowledge. SOLUTION: This method/device generates a command file 21 described with a command supplied to a semiconductor device of a tested object, after converting set information input into a control PC 2, and with detailed information (condition of each signal line) thereof, a counter file 22 described with an address range and an execution frequency, a pattern file 23 described with an execution order of the command, and a data file 24 described with a data signal. A burn-in pattern generating part 11 generates a control signal such as an RAS and CAS supplied to the semiconductor device of the tested object based on the flies 21, 23, generates an address signal based on the file 22, and generates the data signal based on the file 24. The generated burn-in pattern signal is input into the semiconductor device of the tested object attached to a burn-in card 32 to conduct a burn-in test. COPYRIGHT: (C)2005,JPO&NCIPI
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