发明名称 [SILICON OXIDE GAP-FILLING PROCESS]
摘要 A silicon oxide gap-filling process is described, wherein a CVD process having an etching effect is performed to fill up a trench with silicon oxide. The reaction gases used in the CVD process include deposition gases and He/H2 mixed gas as a sputtering-etching gas, wherein the percentage of the He/H2 mixed gas in the total reaction gases is raised with the increase of the aspect ratio of the trench.
申请公布号 US2005074946(A1) 申请公布日期 2005.04.07
申请号 US20030605478 申请日期 2003.10.02
申请人 CHU HSIU-CHUAN;HUANG CHIH-AN;TSAI TENG-CHUN;CHEN NENG-KUO 发明人 CHU HSIU-CHUAN;HUANG CHIH-AN;TSAI TENG-CHUN;CHEN NENG-KUO
分类号 H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/762
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